Testing has never been so easy
Highlights
- Cost-effective tester with a small footprint
- Fast in-circuit test and open pin scan
- Automatic test program creation
- USB connection to PC/notebook
- Reliably detects process errors
Performance has never been so affordable
The SPEA 3030 benchtop is an in-circuit tester with minimal space requirements. There is no need to compromise on test performance, as the tester is equipped with the powerful hardware modules of the SPEA 3030 series.
The SPEA 3030 benchtop is easy to operate. The Leonardo system software enables rapid generation of the test program and simple debugging. Thanks to the user-friendly Leonardo system software, a test program can be created quickly and easily with just a few clicks.
Desktop or notebook: The SPEA 3030 benchtop is connected to a computer via USB and is immediately ready for use. If required, it can be installed in a 19” housing. In addition, the SPEA 3030 benchtop can be combined with any adaptor unit.
Like all systems in the SPEA 3030 series, the benchtop model also guarantees top test performance.
Easy to use
In just a few simple steps, the SPEA 3030 Benchtop software guides the operator from data import to a stable test program.
Small space requirement: 19″
The SPEA 3030 benchtop was designed as a cost-effective but powerful test solution that requires only a minimum of space. The two front handles allow easy removal and make the SPEA 3030 benchtop the perfect portable tester.
PC-independent architecture
The SPEA 3030 benchtop has its own CPU. This means that the test program runs on the internal processor and is independent of the PC.
This also ensures that PC background programs do not affect the test speed. In addition, the PC can be updated or replaced at any time without having to debug test programs again.
Modular architecture
The modular architecture of the SPEA 3030 allows you to configure a powerful multifunction tester to suit your requirements. With its 4U 19-inch frame construction, it can be used as a benchtop, but can also be mounted in a standard rack.
Reduction of field returns
Reduction of field returns – The SPEA 3030 benchtop was developed to help electronics manufacturers ensure the quality of their products. By using innovative test techniques, the SPEA 3030 benchtop reliably detects faults that cannot be detected by conventional ICT testers.
True-Per-Pin architecture
SPEA’s direct pin electronics guarantee reliable testing of complex analog or digital assemblies. When not multiplexed, the pin electronics provide a completely independent stimulus and measurement channel on each channel (1:1). This offers several advantages: faster test generation, simple ECO management, full flexibility.
Performance in the smallest of spaces
16-bit instrumentation, 8-wire measurements, PC-independent architecture. Everything has been designed to ensure reliable testing at the lowest possible cost, even after years of intensive use.
Testperformance
- In-Circuit Test
With the powerful in-circuit test, the SPEA 3030 benchtop quickly finds every process error: short circuits, open pins, incorrectly assembled or reversed components and components whose values are outside the set parameters. - Open pin detection
Two different test techniques are available to clearly identify unsoldered pins (open pins) and other process faults: Electro Scan and Junction Scan.