No additional space required. High throughput.
Highlights
- No additional space required
- Multifunctional test options
- Can be integrated into any production cell
Multi-core board tester without additional space requirement
Reduce the space required to zero with the SPEA 3030 Rack board tester. The tester can be easily integrated into existing automation solutions, third-party systems, existing contacting devices or a 19” housing via the connector interface.
The SPEA 3030 rack offers a wide range of testing capabilities and unparalleled throughput.
Highest accuracy and complete error coverage are guaranteed. Like all SPEA 3030 systems, it has 16-bit instrumentation and can be configured according to your requirements. It offers a wide range of test techniques integrated into a single test station.
After all, integration into third-party systems does more than just save space: common elements such as mechanics and frame construction are used, and the costs for testing are further reduced.
No additional space required: maximize space and resources
The SPEA 3030 Rack offers multifunctional testing without the need for additional space: the tester can be installed in a 19″ housing or integrated into your production line.
PC-independent architecture
With the PC-independent architecture of the SPEA 3030, the test program runs in the tester’s CPU and the test speed is determined by this. This also ensures that PC background programs do not affect the test speed. In addition, the PC can be updated or replaced at any time without having to debug test programs again.
As powerful as everyone in the tester family
As a member of the SPEA 3030 series, the SPEA 3030 Rack offers maximum performance and highest measurement accuracy without requiring additional space. In addition, the direct connection between the SPEA 3030 rack and third-party system interfaces guarantees signal integrity, avoiding losses and signal overlaps.
Easy to use: even without specialist knowledge
The SPEA 3030 Rack is easy to operate. The Leonardo system software enables rapid generation of the test program and simple debugging. The auto-debug and auto-tuning functions support this. This increases the measurement stability and shortens the test time.
Testperformance
- Incircuit test (analog, digital, mixed)
- Power-On-Test
- Function test
- Flashing via the on-board programming
- Open Pin Scan
- Boundary Scan
- Built-In-Self-Test
- Parametrische Tests