Complete fault coverage
High throughput. High scalability.
Highlights
- Parallel tests reduce test costs
- Multifunction: complete fault coverage
- Customizable & flexibly retrofittable
- Testing power electronics with the SPEA power modules
- Automatic test program creation
- Parallel programming of ICs of different types
Multifunctional test options:
100 % coverage with just 1 system.
The SPEA 3030 Multimode is a multifunctional, modular test system that can be configured to customer specifications. It offers complete fault coverage in combination with minimized test costs.
SAVE MONEY – Why buy several testers when you only need one? All tests can be carried out with the SPEA 3030 Inline: Incircuit, cluster and function test, as well as on-board programming and boundary scan. Compared to several test stations, the advantages are enormous: no additional operating personnel, a single test program, reduced floor space and lower operating costs.
SAVE TIME – Drastically reduce testing time with the SPEA 3030 Inline.
The SPEA-specific system architecture with special processors enables different test sequences to be carried out. Redundancies, time-consuming handling and testing of assemblies at several test stations are eliminated. The assemblies pass through the SPEA 3030 Inline once and are tested completely and efficiently.
REDUCING FIELD PRESSURE RUNS – The SPEA 3030 was developed to help electronics manufacturers ensure the quality of their products. By using innovative test techniques, the SPEA 3030 reliably finds faults that cannot be detected by conventional ICT testers.
Quad-core for parallel tests
The SPEA 3030 Multimode can be equipped with up to 4 cores, each with independent CPU, local memory and instrumentation. This allows up to 4 assemblies to be tested in parallel. This reduces testing costs by up to 75% compared to standard ICT testers. You only need one tester, one handling procedure, one adapter and one PC to test four assemblies simultaneously.
Parallel flashing of several components
The SPEA 3030 Multimode can be equipped with one or more flashing modules. This allows both identical and different components to be programmed in parallel. Flashing times and costs are significantly reduced.
PC-independent architecture
With the PC-independent architecture of the SPEA 3030, the test program runs in the tester’s CPU and the test speed is determined by this. This also ensures that PC background programs do not affect the test speed. In addition, the PC can be updated or replaced at any time without having to debug test programs again.
Customizable & flexibly retrofittable
The uncompromising flexibility of our testers guarantees an individual configuration that optimally meets the respective test requirements. You can either configure your tester completely when you buy it or upgrade it gradually – anything is possible. Third-party measuring instruments can also be easily integrated.
The wide range of adaptation options, such as drawer receivers and plug interfaces, are outstanding. Inline contacting unit, Pylon interface but also customer-specific interfaces or receivers from third-party suppliers (Genrad, Ingun, Zentel, etc.)
Precise contacting with receivers from SPEA
The contacting units are integrated directly into the test system. This means that there are no interfering cables between the system modules and the adaptation. Signal integrity is guaranteed. The test system and adaptation are supplied by SPEA as a reliable and cost-effective turnkey test solution.
The contacting of the assembly is safe and precise. With the electromechanical SPEA drawer receiver, the contact pressure speed can be set specifically for the test specimen.
The lowering is always absolutely planar. The contacting level is freely programmable in steps of 100 µm. This allows different contacting levels to be realized, for example for 2-stage contacting during the function test.
Reduction of field returns
Reduction of field returns – The SPEA 3030 Multimode was developed to help electronics manufacturers ensure the quality of their products. By using innovative test techniques, the SPEA 3030 Multimode reliably finds faults that cannot be detected by conventional ICT testers.
Testperformance
- Boundary Scan
Boundary Scan is used when physical access to individual circuit parts is not possible. This means that highly complex assemblies, fine-pitch technology, multilayers and BGAs can be tested without direct contact with the test probes. The parallel use of boundary scan technology and the system modules of the SPEA 3030 Multimode enables broader fault coverage while simultaneously reducing adapter costs (virtual test points instead of real test needles). - Open pin detection
Two different test techniques are available to clearly identify unsoldered pins (open pins) and other process faults: Electro Scan and Junction Scan. - Function test
The SPEA 3030 Multimode not only offers functional tests at component level, but also at cluster and board level. Parameterization is carried out in the Leonardo system software or optionally using higher programming languages such as Microsoft C++, Visual Basic, Borland, Delphi, LabView, etc. - True-Per-Pin architecture
SPEA’s direct pin electronics guarantee reliable testing of complex analog or digital assemblies. When not multiplexed, the pin electronics provide a completely independent stimulus and measurement channel on each channel (1:1). This offers several advantages: faster test generation, simple ECO management, full flexibility. - Parametric ICT at maximum speed
The parametric-dynamic high-speed ICT of the SPEA 3030 Inline checks the parameters of each individual component according to the data sheet. These tests are generated automatically with the help of component libraries. This means short program creation times, short test times and maximum error coverage rates. - Transfer of test programs and adapters to other testers
The SPEA testers are based on a common system architecture. The hardware and software platform is designed so that test programs and adapters can be transferred from one system to another. For the test programs, this applies not only within the SPEA 3030 system family, but also between board and flying probe testers. This enables the greatest possible flexibility in production.