High throughput. High error coverage.
Fully compatible with the SPEA 3030 Inline.
Highlights
- 2-fold parallel test
- Contacting unit compatible with SPEA 3030 Inline
- Parametric high-speed ICT
- Automatic application development
- Diverse test methods
Fully compatible with the SPEA 3030 Inline
The SPEA 3030 Compact extended is a cost-effective needle bed tester with manual handling that is compatible with the SPEA 3030 Inline. The adapter, pressure unit and test program can be quickly and easily ported from the SPEA 3030 CE to the inline tester – and vice versa. The tester has a modular design, can be configured to customer specifications and, thanks to the dual-core parallel tests, it enables twice the throughput. It offers a wide range of test procedures and test options as well as 100% fault coverage.
Parallel tests
The SPEA 3030 Compact extended can be equipped with up to 2 cores, each with independent CPU, local memory and instrumentation. This allows up to 2 assemblies to be tested in parallel.
Transfer of adapters and test programs to the SPEA 3030 Inline
The contacting and pressure unit and test program are fully compatible with the SPEA 3030 Inline. You can quickly and easily switch your production from a system with manual operation to a fully automatic system and vice versa, depending on your production requirements.
PC-independent architecture
With the PC-independent architecture of the SPEA 3030, the test program runs in the tester’s CPU and the test speed is determined by this. This also ensures that PC background programs do not affect the test speed. In addition, the PC can be updated or replaced at any time without having to debug test programs again.
Parallel flashing of several components
The SPEA 3030CE can be equipped with one or more flashing modules. This allows both identical and different components to be programmed in parallel. Flashing times and costs are significantly reduced.
Precise contacting with receivers from SPEA
The contacting units are integrated directly into the test system. This means that there are no interfering cables between the system modules and the adaptation. Signal integrity is guaranteed. The test system and adaptation are supplied by SPEA as a reliable and cost-effective turnkey test solution.
The contacting of the assembly is safe and precise. With the electromechanical SPEA drawer receiver, the contact pressure speed can be set specifically for the test specimen.
The lowering is always absolutely planar. The contacting level is freely programmable in steps of 100 µm. This allows different contacting levels to be realized, for example for 2-stage contacting during the function test.
Parametric ICT at maximum speed
The parametric-dynamic high-speed ICT of the SPEA 3030 Inline checks the parameters of each individual component according to the data sheet. These tests are generated automatically with the help of component libraries. This means short program creation times, short test times and maximum error coverage rates.
Testperformance
- True-Per-Pin architecture
SPEA’s direct pin electronics guarantee reliable testing of complex analog or digital assemblies. When not multiplexed, the pin electronics provide a completely independent stimulus and measurement channel on each channel (1:1). This offers several advantages: faster test generation, simple ECO management, full flexibility. - Open pin detection
Two different test techniques are available to clearly identify unsoldered pins (open pins) and other process faults: Electro Scan and Junction Scan. - Function test
The SPEA 3030CE not only offers functional tests at component level, but also at cluster and board level. Parameterization is carried out in the Leonardo system software or optionally using higher programming languages such as Microsoft C++, Visual Basic, Borland, Delphi, LabView, etc. - Customizable & flexibly retrofittable
The uncompromising flexibility of our testers guarantees an individual configuration that optimally meets the respective test requirements. You can either configure your tester completely at the
Purchase or upgrade successively – anything is possible. Third-party measuring instruments can also be easily integrated. The wide range of adaptation options, such as drawer receivers and plug interfaces, are outstanding. Inline contacting unit, Pylon interface but also customer-specific interfaces or receivers from third-party suppliers (Genrad, Ingun, Zentel, etc.). - Boundary Scan
Boundary Scan is used when physical access to individual circuit parts is not possible. This means that highly complex assemblies, fine-pitch technology, multilayers and BGAs can be tested without direct contact with the test probes. The parallel use of boundary scan technology and the system modules of the SPEA 3030 Compact Extended enables broader fault coverage while simultaneously reducing adapter costs (virtual test points instead of real test needles).