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SPEA 4060s3 Flying Probe Tester

SPEA 4060s3 Flying Probe

SPEA 4060s3 Flying Probe Tester – Contacting the smallest geometries
Ideal for high-volume production & more

The SPEA 4060s3 Flying Probe sets new standards in the flying probe sector.
It offers outstanding testing capabilities and a throughput comparable to a needle bed tester.

 

Highlights

  1. 135 contacts/sec.
  2. Min. Pad size: 50 μm
  3. 6 multi-tool flying probe test heads
  4. Contacting on both sides
  5. Highest error coverage
  6. Innovatives Fahrgestell aus Granit
  7. Compact footprint: 2.2 sqm (23.14 ft2)
  8. App-based system software
  9. Manual loading + inline integration in one system

135 contacts/sec.

Unique drive technology with linear motors and optical encoders on all axes (X, Y and Z) guarantees maximum acceleration and extremely precise contacting. The closed-loop technology guarantees unrivaled repeat accuracy over an infinite number of travels.

Min. Pad size: 30 µm

The extremely precise contacting accuracy is achieved by linear optical encoders on all axes. The SPEA 4060s3 contacts 50μm pads at maximum speed and with absolute precision, without leaving any traces – unique in the flying probe sector.
The programmable contact pressure and the soft landing function ensure that even the most sensitive electronic components (ultra-fine pitch, sticky boards during product start-up, flex assemblies) are contacted precisely and quickly without the risk of damage.

Highest error coverage

The SPEA 4060 s3 offers the complete range of test options with maximum measuring accuracy. The shorter the distance between the needle and the measuring instrument, the faster and more accurate the measurement performed. Therefore, in SPEA Flying Probe systems, the measuring and stimulation instruments are positioned as a test head directly on the needles – the “flying tester concept”. That’s why SPEA testers are the fastest and the most accurate.

Innovative granite chassis

An innovative granite chassis, combined with state-of-the-art linear motor technology, offers unparalleled contact precision with extremely fast test speeds, low vibration, and maximum thermal stability.
Compared to conventional iron or steel, natural granite offers the best damping properties and thermal stability, minimizing vibrations and deformation effects that would compromise accuracy and reliability over time.

Compact footprint: 2.2 sqm (23.14 ft2)

The footprint of the SPEA 4060s3 is very compact: it only requires 2.2 square meters including the inline feed.

Can replace needle bed tester

Thanks to its speed and the associated high productivity, the SPEA 4060 s3 can easily be used where previously only needle bed testers were used, for example in high-volume series production.

High precision measurements

  • High-precision measurement performance and accuracy (0.1pF)
  • Signal integrity
  • No impairment of the measurement results or interference
  • Immediate signal acquisition
  • Unique repeatability

Up to 28 Top & Bottom Flying Test Tools

The eight axes of the SPEA 4060s3 (4 top + 2 bottom) allow the installation of up to 21 flying tools in total: In addition to the probes with which all electrical tests are performed, a variety of other tools are available to extend the test performance of the SPEA 4060s3 Flying Probe.

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SPEA T100L

SPEA T100L – Automatic LED testing system

Complete detection of LED lighting faults

The T100L test system reliably detects defects in electronic components for LED lighting applications. It meets all the requirements of high-volume series production and eliminates the need for expensive adapters with optical fibers.

 

 

The LED tester offers exceptional performance when testing LEDs, eliminates the need for manual function tests, and maintains cycle times in production. The integrated flying scanner technology simultaneously captures and processes the intensity and color parameters of each LED light pixel, allowing multiple LED characteristics to be captured in a single pass.

 

Testing LEDs in conjunction with electronic assemblies is a complex process with high requirements.

The challenge of the test lies in the variability of light intensity and color temperature, the parallel testing of the assembly while simultaneously checking the correct position of the individual LEDs—an area in which efficient automation of the testing process guarantees high profitability.

The T100L tester is the latest system in the SPEA Flying Head series. The tester is based on proven testing technology and offers maximum performance – a worthwhile investment.


Higher product quality through additional testing techniques in the SPEA T100L test system

Performing additional tests on electronic components along the functional chain of LED lights ensures that defective products are filtered out.
SPEA test systems offer complete test coverage without increasing the complexity of the production environment.


SPEA T100L Documentation PDF

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SPEA T300

SPEA T300 in-circuit tester with maximum parallelism

32-fold parallel test

The SPEA T300 board tester has a unique tester architecture with up to 32 parallel incircuit test cores and additional capacity of 256 cores for flashing and functional testing. The asynchronous parallel architecture of the SPEA T300 allows testing and parallel flashing of up to 32 PCBAs (Printed Circuit Board Assembly).

The SPEA T300 Needlebed Tester offers SPEA’s unique ICT-Plus technology, which finds electronic faults that are not detected by conventional ICT tests.

Test and flash a variety of assemblies in parallel

Many assemblies are manufactured in the panel, i.e. a few to a large number of assemblies are connected in the panel assembly to form a large printed circuit board. Each of these individual assemblies in turn contains a few to countless components and parts that must be tested and programmed.

SPEA’s new T300 board tester is specifically designed for user testing, or testing and programming many boards at once. It thus guarantees the highest throughput and the lowest testing and programming costs.

 

 

Programmable as single or dual test station

The SPEA T300 can be programmed as a single or dual test station.

In Single Test Site mode, a single board can be ICT and function tested and flashed.

Dual Test Side enables the simultaneous testing of two boards. This applies to ICT, flash programming and functional testing. To double the throughput, the tester can perform a split test. At Station 1, for example, an ICT is performed while at Station 2 either flashing or a functional test is performed simultaneously.

Operatorless testing

The SPEA T300 can be configured in several automated operating modes that operate unattended

  • Inline loading – Inline unloading
  • Loading from rack – inline unloading [1]
  • Inline loading – unloading in rack [1] [2].
  • Loading from rack – unloading into rack [1] [2].

[1] Option: Rack loading by robot
[2] Option: Pass/Fail sorting

In-circuit tester – connected to the digital ecosystem

The SPEA T300 interacts with the Industrie 4.0 environment and digital ecosystem – in terms of information, notifications, programming commands and machine instructions.

The tester has sensors to detect and observe the environment, wear parts and moving parts, electrical and pneumatic power supplies, and internal and external power supplies. This enables him to:

  • Support for predictive maintenance
  • Error detection in advance, which would lead to malfunctions
  • Estimation of wear and remaining service life of machine parts

The SPEA T300 is designed for continuous and intensive use even in harsh manufacturing environments. Easy to maintain – maintenance can be performed easily and quickly.

ATOS Leonardo 4 ICT is the T300 version of the ATOS system software developed by SPEA for its testers.

ATOS contains all the operating and programming functions needed for the tester. This makes you independent of the Windows® version and the configuration and performance of the system PC.

 

 

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SPEA Board Handling

SPEA Board Handling

SPEA Board Handling – Minimized footprint, maximum effectiveness

With SPEA’s board handling system, you benefit from a state-of-the-art solution that combines efficiency and precision in a compact space. Fully automated transport of PCBs between the rack and tester minimizes manual intervention, shortens process times, and significantly increases the productivity of your production. The system impresses with its reliable assembly handling, short cycle times, and optimal use of available production space—ideal for modern, automated test environments.

Fully compatible—automated board handling for all inline-capable SPEA testers

The automated board handling system, developed and produced by SPEA, enables the automatic loading of assemblies and components from rack to tester and from tester to rack.

The handling modules are fully compatible with all inline-capable SPEA test systems – both existing and new systems. The use of SPEA modules ensures absolute compatibility between handling and tester, and therefore reliable production. Our customer service offers you professional support during installation and beyond.

Modular handling equipment with a small footprint

The automated board handling system from SPEA is characterized by a compact, modular architecture and thus offers a cost-effective system with a small footprint.

The modular architecture allows you to configure your handling system to suit your needs. The modules can be added, exchanged or moved within the same or in other test cells to change the conveying path (pass-back, pass-through or mixed). This means you are optimally equipped for every requirement in current or future production.

All modules of the SPEA handling system require only 1/3 of the floor space of conventional handling segments. The smallest module has a footprint of just 0.7 square meters. A typical pass-through configuration takes up just 1.31 square meters of space – compared to 3.38 square meters for conventional automation solutions.

Rack positioning can be carried out manually or automatically in various ways, e.g. with AGVs, robots, conveyor belts or local magazine buffers. The rack positioning height is programmable to simplify operating procedures or to set the correct height for operation with robots or AGVs.

SPEA Board Handling – Designed for the future of testing

The handling of the assembly is completely controlled by the SPEA tester software. Communication between the tester and LAN via the Ethernet TCP/IP interface utilizes the benefits of Industry 4.0: production and sensor data can be transferred to big data systems for predictive maintenance.

The SPEA handling system consists of durable, maintenance-free modules to ensure operational reliability over a long period of time. The sensors used in combination with the software used ensure that all steps are carried out in a fully controlled manner.

Full integration with SPEA tester and software

Installation of the SPEA handling modules is professional and simple: they simply need to be connected to the power supply and the communication interfaces of the tester (SMEM, Hermes, TCP/IP) – that’s it! The tester software contains all the necessary drivers for controlling automated handling.

The desired operating mode of the handling system (e.g. pass-through or pass-back) can be selected directly in the test program, so that no additional operating effort is required when changing products.

The sorting of the assemblies can also be defined directly in the test program. For example, with pass-fail sorting in the same magazine, in separate magazines or in permanently assigned magazine slots.

 

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SPEA 4080X Flying Probe Tester

SPEA 4080X Flying Probe Tester

Testing of power electronics
The first tester to perform an in-circuit test on power electronics assemblies

Automatic testing of large
and complex boards

The SPEA 4080X is designed for adapterless testing of power electronics assemblies – including inverters, power supplies, power supplies and high density assemblies.

The tester easily and automatically transports large and heavy assemblies (15 kg and more) and tests them ultra-fast and with high precision – digital, analog, power electronics, supercapacitors, tests under high voltage or of relays as well as polarity tests and, of course, mechanical elements such as magnets, LEDs, displays, etc.

Furthermore, the system offers additional techniques such as optical testing, flashing or RTC calibration, etc.

Advantages

Testing power boards with the SPEA 4080X offers major advantages:
The failure rate in the final functional test (end-of-line test) is virtually zero.
Reliable and precise diagnosis at component level significantly reduces repair costs. There is no need for a long and time-consuming search for the cause of the fault.
Early fault detection ensures optimized workflows and processes.
Test equipment for functional and end-of-line tests can be simplified, reducing the overall test time.

Performance features

Max. Component height: 150 mm

The SPEA 4080X was designed to enable the testing of assemblies with components up to 150 mm in height without any problems and to the full extent.
No other flying probe tester can test boards with components of this height and even increase the test depth, as it also makes contact where needle bed testers reach their limits.

Automated handling of large boards

Operator-free operation, direct integration into SMT lines or test cells

Complete tests

No failures during final functional/EOL test, reduction of field returns.

High throughput

Lowest test costs, Direct integration into SMT lines or test cells

180 contacts/sec

Unique drive technology with linear motors and optical encoders on all axes (X, Y and Z) guarantees maximum acceleration and extremely precise contacting. The closed-loop technology guarantees unrivaled repeat accuracy over an infinite number of travels.

Min. Pad size: 50 µm

The extremely precise contacting accuracy is achieved by linear optical encoders on all axes. The SPEA 4080X contacts 50μm pads at maximum speed and with absolute precision, without leaving any traces – unique in the flying probe sector.
The programmable contact force and soft landing function ensure that even the most sensitive electronic components (ultra-fine pitch, sticky boards during product start-up, flex assemblies) are contacted precisely and quickly without risk of damage.

Highest error coverage

The SPEA 4080X offers the full range of test capabilities with the highest measurement accuracy. The shorter the distance between the needle and the measuring instrument, the faster and more accurate the measurement performed. Therefore, in SPEA Flying Probe systems, the measuring and stimulation instruments are positioned as a test head directly on the needles – the “flying tester concept”. That’s why SPEA testers are the fastest and the most accurate.

Innovatives Fahrgestell aus Granit

An innovative granite chassis, combined with state-of-the-art linear motor technology, offers unparalleled contact precision with extremely fast test speeds, low vibration, and maximum thermal stability.
Compared to conventional iron or steel, natural granite offers the best damping properties and thermal stability, minimizing vibrations and deformation effects that would compromise accuracy and reliability over time.

Compact footprint: 2.4 m2 (25.83 ft2)

The footprint of the SPEA 4080X is very compact: it requires only 2.2 m2 including inline feed.

Can replace needle bed tester

Due to its speed and the associated high productivity, the SPEA 4080X can easily be used where previously only needle bed testers were used, for example also in high-volume serial production.

High precision measurements

High-precision measurement performance and accuracy (0.1pF), Signal integrity, No degradation of measurement results or interference, Instantaneous signal acquisition, Unique repeat accuracy

Up to 28 Top & Bottom Flying Tools

The eight axes of the SPEA 4080 (4 top + 4 bottom) allow the installation of up to 28 flying tools in total: In addition to the probes with which all electrical tests are performed, a variety of other tools are available to extend the test performance of the SPEA 4080.

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SPEA 3030X In-Circuit Tester

spea-3030x

Test of power electronics

 

Automatic testing of large and complex boards

The SPEA 3030X is designed for fixtureless testing of power electronics assemblies – including inverters, power supplies, power supplies and high density assemblies.

The tester easily and automatically transports large and heavy assemblies (10 kg and more) and tests them ultra-fast and with high precision – digital, analog, power electronics, supercapacitors, tests under high voltage or of relays as well as polarity tests and of course mechanical elements such as magnets, LEDs, displays, etc.

Furthermore, the system offers additional techniques such as optical tests, flashing or RTC calibration, etc.

Advantages of the SPEA 3030x

  • Testing power boards with the 3030X offers great advantages:
  • The failure rate during the final function test (end-of-line test) is almost zero
  • Reliable and precise diagnosis at component level significantly reduces repair costs. A long and time-consuming search for the cause of the error is no longer necessary.
  • Early error detection ensures optimized workflows and processes
  • Test equipment for functional and end-of-line testing can be simplified, reducing overall test time.

Highlights

Automatic handling of large boards
Unattended operation, direct integration into SMT lines or test cells

Complete testing
No failures in the final functional/EOL test, reduction in field returns

High throughput
Lowest testing costs, capability to respect SMT line takt time

Multifunction tester: 100% coverage with just 1 device

From manufacturing defects analyzers to high-performance systems, SPEA board testers offer the superior solution for parametric and dynamic functional tests at component, cluster and board level. We test 100% of all electronic, mechanical and electromechanical components on the assembly.

Testperformance

The SPEA 3030X offers a comprehensive range of test techniques and detects defective components and process faults safely and reliably. This reduces the occurrence of failures or undetected faults in the function test and thus also the risk of field returns.

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SPEA 3030T Function and end-of-line tester

SPEA 3030T Function and end-of-line tester

SPEA 3030T functional and end-of-line tester for precise electronics testing

The SPEA 3030T functional and end-of-line tester is a compact, modular test system designed for reliable and cost-effective functional testing of electronic assemblies. This system offers maximum flexibility and is ideal for applications in electronics manufacturing where quality and precision are critical.

Cost-effective, flexible, and reliable

The SPEA 3030T tester allows functional tests to be performed efficiently and comprehensively. Thanks to its modular architecture, the system can be individually configured or built to order to optimally meet specific test requirements. This makes it ideal for companies that need a cost-effective yet powerful test solution.

Multifunctional test platform

The SPEA 3030T tester enables multifunction testing, ensuring unique test coverage. The use of state-of-the-art technologies allows for precise testing of electronic components—from simple functional tests to complex end-of-line tests.

Typical test objects are:

  • Electronic modules and assemblies
  • Power supplies and inverters
  • PLCs and control units
  • Smartphones and consumer electronics
  • Vehicle control units and engine control units

Compact and ergonomic design

Thanks to its compact tower design, the SPEA 3030T functional and end-of-line tester requires little space and can be easily integrated into existing production lines. Its ergonomic design facilitates operation and maintenance, reducing downtime and increasing efficiency.

Globally proven testing technology

SPEA functional testers are used worldwide in production facilities to ensure that electronic devices work reliably before they are shipped. With the SPEA 3030T, manufacturers benefit from a system that combines precision, modularity, and cost-effectiveness.

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SPEA T100 LED Tester

SPEA T100 LED tester

SPEA T100 LED tester for precise calibration and testing

The SPEA T100 LED Tester is a state-of-the-art test system for calibration, electrical, optical, and mechanical testing of a wide range of electronic devices and assemblies. This fully automatic system combines all test functions in one device—efficient, precise, and flexible.

Everything in one system – for maximum precision

The SPEA T100 LED tester was developed to efficiently test and calibrate complex products in the fields of micro-optics, MEMS, sensor technology, and micromechanics. Thanks to up to eight freely movable test heads (four at the top, four at the bottom), different tests can be performed simultaneously and with high precision. This eliminates the need for an additional test system—everything is done in a single, fully integrated process.

Automated test system with versatile functions

This automatic test system is fully programmable and can be configured for different product variants. It combines electrical, mechanical, and optical test methods and offers exceptional test coverage. The ATOS system software enables automatic test generation and ensures precise, repeatable results.

Flexible test modules and actuators

The SPEA T100 LED tester can be equipped with a wide variety of tools, including:

  • Pressure actuators for pressure-sensitive components such as keyboards or displays
  • Z actuators for precise movements in the Z axis
  • Laser modules for measuring shape and flatness
  • Exposure meter for LED, LIDAR, or display testing
  • Light sources and cameras for AOI and surface inspection
  • Sound modules for acoustic testing
  • Power screwdrivers for assembly and calibration tasks

Test types and measurement methods

The SPEA T100 supports electrical, optical, mechanical, and thermal test procedures:

  • Electrical: Function test, RF test, flashing, power measurement
  • Visual: AOI, laser test, light test
  • Mechanical: Pressure and movement test
  • Thermal: Temperature measurement and control

The assemblies are recognized by 2D barcode or RFID systems, which facilitates integration into automated production lines.

Inline system for modern manufacturing

The SPEA T100 optomechatronic tester can be configured as an inline version, making it perfectly suited to high-throughput production environments. Its flexible platform offers space for additional actuators or test tools, enabling maximum test coverage.

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SPEA 3030IL In-Circuit Tester

SPEA 3030 inline

SPEA 3030 Inline – 4-fold parallel testing, ultra-fast handling.
No operator required. Minimal testing costs.

Highlights of the SPEA 3030 inline

  1. 4x throughput with quad-core architecture
  2. No costs for operating personnel
  3. Ultra-fast handling in 3 seconds
  4. 5000+ tests/sec.
  5. Automatic test program generation
  6. Parallel programming of ICs of different types

High Volume. High quality.
Low testing costs.

The SPEA 3030 Inline is optimized for use in automated production environments. It can be easily integrated into SMEMA production lines or combined with standard automatic loading and unloading systems. The system has a modular design and can be configured according to customer requirements. In addition to the in-circuit test, the SPEA 3030 Inline also performs digital tests and tests power electronics assemblies.

Quad-core for parallel tests

The SPEA 3030IL can be configured as a multi-core system with up to 4 independent cores, each with its own CPU, local memory, and instrumentation. This allows up to 4 assemblies to be tested simultaneously. The throughput of the SPEA 3030 Inline is thus up to 400% higher, which minimizes test costs.

Ultra-fast handling

The SPEA 3030IL is equipped with a newly designed handling module that halves handling time compared to the previous model. 3 seconds are enough to handle a medium-sized assembly – including loading, pressing on and releasing the adapter and final unloading.

Adapter and test program are compatible with the manually operated variants of the system family

The SPEA 3030 Inline is fully compatible with systems that are operated manually. You can switch from an inline tester to a manual tester and vice versa. This means that debugging can be carried out on a manual system and the inline system can continue to be used in production.

Maximum throughput thanks to multi-stage

With the multi-stage option, the SPEA 3030IL can perform various test procedures simultaneously (e.g., in-circuit + functional test, in-circuit + flashing, etc.). This optimizes the test time and reduces costs.

No operating personnel required for the SPEA 3030 inline

The SPEA 3030IL does not require any operating personnel. The system works fully automatically in inline production or with loaders and unloaders. It is controlled via SMEMA or HERMES. This increases throughput and drastically reduces testing costs.

Highest test speed

Compared to conventional needle bed testers, the test speed of the SPEA 3030 is significantly higher. A dedicated CPU in each core guarantees delay-free communication between instruments and PC. High-performance relays ensure fast switching times. The system architecture minimizes the setup of the instruments. It is also possible to carry out different measurements simultaneously with a single core.

Controlled contacting with motorized receiver

The electromechanical contacting unit is integrated directly into the test system. This means that there are no interfering cables between the system modules and the adaptation, and signal integrity is guaranteed. The test system and adaptation were developed by SPEA as a reliable and cost-effective turnkey test solution. The contacting of the assembly is safe and precise. The contact pressure speed of the receiver can be set specifically for the test specimen. The lowering is always absolutely planar. The contacting level is freely programmable in steps of 100 µm. This allows different contacting levels to be realized, for example for 2-stage contacting during the function test.

Parallel flashing of several components

The SPEA 3030 Inline can be equipped with one or more flashing modules. This allows both identical and different components to be programmed in parallel. Flashing times and costs are significantly reduced.

Parametric ICT at maximum speed

The SPEA 3030 Inline can be equipped with one or more flashing modules. This allows both identical and different components to be programmed in parallel. Flashing times and costs are significantly reduced.

Customizable & flexibly retrofittable

The uncompromising flexibility of our testers guarantees an individual configuration that optimally meets the respective test requirements. You can either configure your tester completely when you buy it or upgrade it gradually – anything is possible. Third-party measuring instruments can also be easily integrated.

PC-independent architecture

With the PC-independent architecture of the SPEA 3030, the test program runs in the tester’s CPU and the test speed is determined by this. This also ensures that PC background programs do not affect the test speed. In addition, the PC can be updated or replaced at any time without having to debug test programs again.

 

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SPEA 3030M In-Circuit Tester

SPEA 3030M

Complete error coverage
High throughput. High scalability.

Highlights of the SPEA 3030M

  1. Parallel tests reduce test costs
  2. Multifunction: complete fault coverage
  3. Customizable & flexibly retrofittable
  4. Testing power electronics with the SPEA power modules
  5. Automatic test program creation
  6. Parallel programming of ICs of different types

Multifunctional testing capabilities:
100% coverage with just one system.

The DSPEA 3030M test system is a multifunctional, modular test system that can be configured to customer specifications. It offers complete fault coverage in combination with minimized test costs.

SAVE MONEY – Why buy several testers when you only need one? All tests can be performed with the SPEA 3030M Inline: in-circuit, cluster, and functional tests, as well as on-board programming and boundary scan. Compared to several test stations, the advantages are enormous: no additional operating personnel, a single test program, reduced floor space and lower operating costs.

SAVE TIME – Drastically reduce test time with the SPEA 3030 Inline.
The SPEA-specific system architecture with special processors enables different test sequences to be performed. Redundancies, time-consuming handling and testing of assemblies at several test stations are eliminated. The assemblies pass through the SPEA 3030 Inline once and are tested completely and efficiently.

REDUCING FIELD FAILURES – The SPEA 3030M was developed to help electronics manufacturers ensure the quality of their products. By using innovative test techniques, the SPEA 3030 reliably finds faults that cannot be detected by conventional ICT testers.

Quad-core for parallel tests

The SPEA 3030 Multimode can be equipped with up to 4 cores, each with independent CPU, local memory and instrumentation. This allows up to 4 assemblies to be tested in parallel. This reduces testing costs by up to 75% compared to standard ICT testers. You only need one tester, one handling procedure, one adapter and one PC to test four assemblies simultaneously.

Parallel flashing of several components

The SPEA 3030 Multimode can be equipped with one or more flashing modules. This allows both identical and different components to be programmed in parallel. Flashing times and costs are significantly reduced.

PC-independent architecture

With the PC-independent architecture of the SPEA 3030, the test program runs in the tester’s CPU and the test speed is determined by this. This also ensures that PC background programs do not affect the test speed. In addition, the PC can be updated or replaced at any time without having to debug test programs again.

Customizable & flexibly retrofittable

The uncompromising flexibility of our testers guarantees an individual configuration that optimally meets the respective test requirements. You can either configure your tester completely when you buy it or upgrade it gradually – anything is possible. Third-party measuring instruments can also be easily integrated.
The wide range of adaptation options, such as drawer receivers and plug interfaces, are outstanding. Inline contacting unit, Pylon interface but also customer-specific interfaces or receivers from third-party suppliers (Genrad, Ingun, Zentel, etc.)

Precise contacting with receivers from SPEA

The contacting units are integrated directly into the test system. This means that there are no interfering cables between the system modules and the adaptation. Signal integrity is guaranteed. The test system and adaptation are supplied by SPEA as a reliable and cost-effective turnkey test solution.
The assembly is contacted securely and precisely. With the SPEA electromechanical drawer receiver, the contact pressure speed can be adjusted to suit the specific test piece.
The lowering process is always completely planar. The contacting level is freely programmable in steps of 100 µm. This allows different contacting levels to be realized, for example for 2-stage contacting during the function test.

Reduction of field returns

Reduction of field returns – The SPEA 3030 Multimode was developed to help electronics manufacturers ensure the quality of their products. By using innovative test techniques, the SPEA 3030 Multimode reliably finds faults that cannot be detected by conventional ICT testers.

Testperformance

  • Boundary scan
    Boundary scan is used when physical access to individual circuit components is not possible. This means that highly complex assemblies, fine-pitch technology, multilayers and BGAs can be tested without direct contact with the test probes. The parallel use of boundary scan technology and the system modules of the SPEA 3030 Multimode enables broader fault coverage while simultaneously reducing adapter costs (virtual test points instead of real test needles).
  • Open pin detection
    Two different test techniques are available to clearly identify unsoldered pins (open pins) and other process errors: Electro Scan and Junction Scan.
  • Function test
    The SPEA 3030 Multimode offers function tests not only at the component level, but also at the cluster and board levels. Parameterization is carried out in the Leonardo system software or optionally using higher programming languages such as Microsoft C++, Visual Basic, Borland, Delphi, LabView, etc.
  • True-Per-Pin Architecture
    SPEA’s direct pin electronics guarantee reliable testing of complex analog or digital assemblies. When not multiplexed, the pin electronics provide a completely independent stimulus and measurement channel on each channel (1:1). This offers several advantages: faster test generation, simple ECO management, full flexibility.
  • Parametric ICT at maximum speed
    The parametric-dynamic high-speed ICT of the SPEA 3030 Inline tests the parameters of each individual component according to the data sheet. These tests are generated automatically with the help of component libraries. This means short program creation times, short test times and maximum error coverage rates.
  • Transfer of test programs and adapters to other testers
    SPEA testers are based on a common system architecture. The hardware and software platform is designed so that test programs and adapters can be transferred from one system to another. For the test programs, this applies not only within the SPEA 3030 system family, but also between board and flying probe testers. This enables the greatest possible flexibility in production.

 

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